Atomic Force Microscope

Abstract

The scanning tunneling microscope is proposed as a method to measure forces as small as ${10}^{\ensuremath{-}18}$ N. As one application for this concept, we introduce a new type of microscope capable of investigating surfaces of insulators on an atomic scale. The atomic force microscope is a combination of the principles of the scanning tunneling microscope and the stylus profilometer. It incorporates a probe that does not damage the surface. Our preliminary results in air demonstrate a lateral resolution of 30 \AA{}A and a vertical resolution less than 1 \AA{}.